Keywords: Advanced Imaging Techniques SEM-EDS IR Microscopy FlatQUAD Nanotechnology Additive Tracing Material Characterization Instrumentation Developments Data Analysis AI in Material Science Environmental Analysis Coatings Technology Corrosion Imaging UV Curing Battery Technology
Wednesday 7.5.2025 | Thursday 8.5.2025 | Friday 9.5.2025 | |
Keynotes | 9.00—16.00 | 8.00—09.00 Annual Meeting of the Finnish Electron Microscopy Society (SEMS) 9.00—15.30 | 9.00—14.00 |
Equipment Demonstrations | CA (at venue, Top Analytica Ltd.) | CA (at venue, Top Analytica Ltd.) | SEM demo (Top Analytica Ltd.) µ-FTIR demo (Top Analytica Ltd.) |
Additional Program | 18.00—20.00 Gala Dinner |
Speakers | Ville Saarimaa, Top Analytica Ltd. Gaurav Mohanty, Tampere University Thao Nguyen, KTH Royal Institute of Technology in Stockholm Antti Kalanti, Blue Scientific Ltd. Jyrki Juhanoja, Top Analytica Ltd. |
Exhibitors