Webinar: Introduction to Broad Ion Beam (BIB): A Preparation Tool for Microanalysis

Abstract

Proper sample preparation is crucial for obtaining reliable information about any kind of material. Cross-sectioning of solid materials can be accomplished through various methods, each with its own advantages and disadvantages. Therefore, selecting the appropriate method for a specific sample type is important.

This webinar will focus on Broad Ion Beam (BIB) milling and provide an introduction to the method, followed by examples of different types of samples prepared with BIB. This method is particularly well-suited for delicate samples that could be damaged or altered during mechanical preparation.

Mark your calendars: Advanced Sample Preparation Workshop &
BIB User Meeting 18.—19.11.2026

Master the Broad Ion Beam (BIB) milling technique and solve your cross-sectioning challenges. Join us for a two-day intensive event focused on Broad Ion Beam (BIB) milling technology. Or choose to attend only the user meeting (for existing users), where we dig deeper into the possibilities with this sample preparation technique! This event is organized in collaboration between Top Analytica and Spectral at Top Analytica, Turku, Finland.

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Check out also our previous webinar: Modern analytical tools for coating degradation characterization