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Webinar: Introduction to Broad Ion Beam (BIB): A Preparation Tool for Microanalysis Speaker: Markus Virtanen 6th of June, 2024 Key Moments in Webinar on Broad Ion Beam (BIB) Technology for Microanalysis 00:02 - Introduction to BIB Technology Introduction to BIB technology for microanalysis, emphasizing smooth cross-section surfaces and minimal sample damage. Explanation of BIB operation: ion beams cut through samples, avoiding mechanical stress and sample manipulation. Visual demo of BIB milling with a titanium blade for even cut surfaces and detailed analysis. 06:12 - Ion Milling Process Sample preparation: manual attachment to a blade, cutting, polishing, and ion beam analysis. Ion milling system components: ion guns, Faraday cups, and a rotating sample in a vacuum. Factors affecting ion milling: sample dryness, cooling options, ion beam energy, and beam width. 13:02 - Advantages of BIB System Benefits of BIB: no manual stretching, maintaining sample integrity, no need for epoxy embedding. Comparison of manual polishing vs. BIB system. Application of BIB: examining cracks in coating layers and surface analysis without embedding. 19:33 - Results of Ion Milling Detailed ion milling process: creating wider cross-sections and examining polymer-filled VRE cuts. Analysis of conductive tracks on silicon samples, needing multiple cross-sections. Examination of deformations in polymer paint layers on zinc-coated steel, comparing primer and top coat layers. 26:00 - Cross-Section Analysis Importance of cross-section analysis: revealing internal conditions and root causes of issues. Examining primer layers and top coats for localized deformations and damage insights. Comparison of corrosion products beneath intact paint layers. Challenges in sample preparation: preserving essential components with ion milling vs. manual polishing. 32:36 - Specialized Applications and Techniques Use of liquid nitrogen cooling for biological sample preparation. Speaker's challenging sample preparation experience with a silicon disc. Comparison of traditional FIB vs. plasma FIB techniques. Dealing with non-flat or fragile samples: polishing uneven surfaces or using epoxy. 39:19 - Sample Preparation for Ion Milling Attaching samples with silver paint for smooth cross-section surfaces. Addressing wave-like structures: ensuring even surfaces, polishing blade and sample, and adjusting ion gun angle. Time for preparation and measurement varies from 2 to 20 hours based on sample type and urgency. 46:28 - Choosing Between Mechanical Polishing and BIB Technique Decision factors: sample size and area of interest, with BIB being easier for smaller areas. BIB technique reduces the need for extensive cleaning post-preparation. Considerations: availability of a hot mounting system and conductive resin requirements.
- Vuosi
- 2024
- Kesto
- 52 min 19 s
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