Advanced Sample Preparation Workshop & BIB User Meeting

Join us for a two-day intensive event focused on Broad Ion Beam (BIB) milling technology. Or choose to attend only the user meeting (for existing users), where we dig deeper into the possibilities with this sample preparation technique!

This event is organized in collaboration between Top Analytica and Spectral. Whether you are a newcomer curious about the possibilities of ion beam milling or an experienced user looking to refine your techniques, this workshop offers a unique blend of theoretical knowledge, practical case studies, and hands-on experience.

When: Wednesday–Thursday, November 18–19, 2026
Where: Top Analytica, Ruukinkatu 4, 20540 Turku, Finland
Why: Master the Broad Ion Beam (BIB) milling technique and solve your cross-sectioning challenges.
Participation fee: Day 1: € 50 + VAT (Includes catering and evening social). Day 2: Free!