Workshop
Join us for a two-day intensive event focused on Broad Ion Beam (BIB) milling technology. This event is organized in collaboration between Top Analytica and Spectral. Whether you are a newcomer curious about the possibilities of ion beam milling or an experienced user looking to refine your techniques, this workshop offers a unique blend of theoretical knowledge, practical case studies, and hands-on experience.
When: Wednesday–Thursday, September 23–24, 2026
Where: Top Analytica, Ruukinkatu 4, 20540 Turku, Finland
Why: Master the Broad Ion Beam (BIB) milling technique and solve your cross-sectioning challenges.
Participation fee: Day 1: € 50 + VAT (Includes catering and evening social). Day 2: Free!
Why Attend
- Expert Insights: Hear from international guest speakers and industry experts about the latest advancements in BIB technology.
- Real-World Results: See the outcomes of the pre-sent demo samples analyzed with both BIB and SEM.
- Hands-on Learning: Get closer to the instrument and learn the nuances of high-quality sample preparation.
- Network: Connect with the Nordic microscopy community to share best practices and solve common preparation challenges.
This mini-workshop is designed to be highly interactive: participants are encouraged to ask questions, discuss challenges, and explore their own research in real time with our experts.
Demo Samples: Get Your Material Analyzed
One of the highlights of the workshop is the opportunity to see your own materials prepared and analyzed using advanced BIB technology.
How it works:
- Expert Preparation: Submitted samples will be sent to Germany, where they will be prepared and analyzed by specialists using the latest ion beam milling equipment.
- Live Results: The results, including high-resolution cross-sections and analysis, will be presented by our experts during the workshop on Day 1. The physical samples will be brought to the event.
- Deadline: To allow enough time for preparation and imaging in Germany, samples must be shipped by June 30, 2026. Detailed shipping instructions and the required sample data sheet will be provided automatically upon registration.
Please note: Due to limited time slots for the demo, we recommend early registration and sample submission.
Program
Day 1: Advanced Sample Preparation Workshop
Wednesday, Sept 23, 2026
| Time | Session |
| 09:30 | Registration and Light Breakfast |
| 10:00 | Welcoming Words – Introduction & inspiring case studies by Top Analytica |
| 10:30 | BIB Technology Lectures – Fundamentals and advanced applications (Guest speaker from Germany) |
| 12:00 | Lunch Break |
| 13:00 | Demo Sample Results – Presentation of results from the pre-submitted samples (Spectral) |
| 14:00 | Optional: Comparative analysis of demo samples using Top Analytica’s SEM |
| 14:30 | Coffee & Networking Break |
| 15:00 | Top Analytica Facility Tour – General presentation and laboratory walkthrough |
| 17:30 | Evening Social Event – Dinner and networking |
Thursday 24.9.2026 — BIB User Meeting
Thursday, Sept 24, 2026 – Focus: Current Users & Practical Application
| Time | Session | 09:00 | User Presentations – Short (15—20 min) case studies from BIB users and open discussion |
| 11:00 | Lunch Break |
| 12:00 | Hands-on Session – Practical demonstration at the instrument: sample mounting, parameter selection, and polishing steps |
| 14:00 | Farewell Coffee |
| 15:00 | (SEMS meeting?) |
Program content is subject to change at the discretion of the organizers.
Networking
After a day of deep dives into ion milling, we invite all participants to join us for an Evening Social on Wednesday, September 23rd at 17:30. This is a great opportunity to continue discussions in a relaxed atmosphere, enjoy good food, and strengthen the local microscopy network.
Registration
Registration Deadline: September 11, 2026.
Demo Sample Submission: If you wish to have your sample prepared for the demo, please submit it by June 30, 2026.
For any inquiries or assistance, please contact:
Markus Virtanen
+358 44 756 2062
info@topanalytica.com
This workshop is organized in collaboration with
