Advanced Sample Preparation Workshop & BIB User Meeting

Advanced Sample Preparation Workshop &
BIB User Meeting 18.—19.11.2026

Workshop

Join us for a two-day intensive event focused on Broad Ion Beam (BIB) milling technology. Or choose to attend only the user meeting (for existing users), where we dig deeper into the possibilities with this sample preparation technique!

This event is organized in collaboration between Top Analytica and Spectral. Whether you are a newcomer curious about the possibilities of ion beam milling or an experienced user looking to refine your techniques, this workshop offers a unique blend of theoretical knowledge, practical case studies, and hands-on experience.

When: Wednesday–Thursday, November 18–19, 2026
Where: Top Analytica, Ruukinkatu 4, 20540 Turku, Finland
Why: Master the Broad Ion Beam (BIB) milling technique and solve your cross-sectioning challenges.
Participation fee: Day 1: € 50 + VAT (Includes catering and evening social). Day 2: Free!

Demo Samples: Have Your Material Analyzed

One of the highlights of the workshop is the opportunity to have your own materials professionally prepared and analyzed using advanced BIB technology.

All submitted samples go through a pre-screening process before any preparation or analysis takes place. Please do not ship samples before receiving confirmation and instructions from the organizers.

If you are interested in submitting a demo sample, simply indicate your interest in the registration form. After registering, you will receive the following information from Spectral:

  • detailed sample preparation instructions
  • shipping instructions
  • a required sample data sheet

Please note that workshop samples are intended for educational and demonstration purposes. Selected samples, along with the resulting images, measurements, and analysis data, are presented and discussed openly during the workshop!

For additional questions, you are welcome to contact Sten Sturefelt at Spectral.

How It Works

1. Pre-screening and Selection

All submitted samples are carefully reviewed through a pre-screening process. Due to limited capacity, only a small number of samples will be selected for preparation and analysis.

2. Expert Preparation in Germany

Selected samples will be sent to Germany, where specialists will prepare and analyze them using state-of-the-art ion beam milling equipment.

3. Results Presented at the Workshop

During Day 1 of the workshop, experts will present the prepared cross-sections and analysis results, including high-resolution imaging and discussion of the sample preparation process. Physical samples will also be available for viewing during the event.

Additional Notes

  • A maximum of four samples will be selected for ion milling and full analysis in the demo lab in Germany
  • Sample capacity is limited, so early registration is recommended
  • All shipments must include the required safety documentation (MSDS)

Program

Wednesday 18.11.2026 — Advanced Sample Preparation Workshop

Time Session
09:30Registration and Light Breakfast
10:00Welcoming Words – Introduction & inspiring case studies by Top Analytica
10:30BIB Technology Lectures – Fundamentals and advanced applications (Justyna Grzonka, Senior Application Specialist at Hitachi High-Tech Europe GmbH)
12:00Lunch Break
13:00Demo Sample Results – Presentation of results from the pre-submitted samples (Spectral)
14:00Optional: Comparative analysis of demo samples using Top Analytica’s SEM
14:30Coffee & Networking Break
15:00Top Analytica Facility Tour – General presentation and laboratory walkthrough
17:30Evening Social Event – Dinner and networking

Thursday 19.11.2026 — BIB User Meeting

Focus: Current Users & Practical Application

Time Session
09:00User Presentations – Short (15—20 min) case studies from BIB users and open discussion
11:00Lunch Break
12:00Hands-on Session – Practical demonstration at the instrument:
  • Sample mounting: New accessories for quicker and more efficient sample fixation.
  • Sensitive samples: Accessories for Air Protection and Cryo preparation.
  • Thumb rules: Parameter selection and polishings steps for common samples
  • Sample throughput: How to use the new Multi-sample holder.
  • Handle large samples: How to extend the cross-section width to 40 mm.
  • Automation: Discover the visual programming tools for a smarter way of cross-sectioning selected areas.
  • Camera solutions: For easier shared observation and process recording
14:00Farewell Coffee
15:00Hands-on Session continued.

Program content is subject to change at the discretion of the organizers.

Networking

After a day of insights into ion milling, we invite all participants to join us for an Evening Social on Wednesday, November 18th at 17:30. This is a great opportunity to continue discussions in a relaxed atmosphere, enjoy good food, and strengthen the local microscopy network.

Registration

Registration Deadline: November 6, 2026.
Demo Sample Submission: If you wish to have your sample prepared for the demo, please submit it to pre-screening by September 15, 2026.

For any inquiries or assistance regarding registration or the event, please contact:
Martina Munther, Top Analytica
+358 44 714 7413
info@topanalytica.com

For assistance in sample-related questions, please contact:
Sten Sturefelt, Spectral
+46 709 119 280
sten.sturefelt@spectral.se

    Participant Information

    Attendance

    Billing Details

    Workshop Context

    What specific materials or components do you work with, and what is the primary goal of your analysis? (e.g., cross-sectioning of multi-layered drug coatings, interface analysis of battery materials, etc.)

    Do you have a specific sample preparation challenge or a "troublesome material" you would like to discuss during the workshop?

    If yes, detailed sample preparation and shipping instructions will be provided to you.

    We welcome real-world case studies and practical experiences with BIB. Selected contributors will be contacted by the organizers.

    Additional Information

    Consent


    We use the information provided to organize the event. Read more at Top Analytica Ltd.'s
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    This workshop is organized in collaboration with

    Advanced Sample Preparation Workshop & BIB User Meeting
    • Top Analytica Oy Ab
    • Ruukinkatu 4, 20540 Turku (sijaitsee Old Mill -teknologiakiinteistön sisäpihalla)
    • Puhelin: 02-2827780
    • Asbestitiimi: +358 44 787 4845
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