Equipment List – Analytical and Measurement Instruments for Materials Research and Surface Analysis

We provide comprehensive analytical and measurement services for materials research, failure analysis, and product development. Our laboratory is equipped with a wide range of SEM, EDS, EBSD, TOF-SIMS, FT-IR, Raman, and XRF instrumentation. Below is an overview of our key analytical equipment and their typical applications.

Electron Microscopy (SEM)

Scanning Electron Microscopy (SEM) is used to investigate surface structures, defects, and microstructures. EDS and EBSD techniques enable elemental composition and crystallographic analysis.

• SEM Zeiss Gemini II 450
• SEM Zeiss LEO 1530 VP
• SEM-EDS JEOL JSM-IT100
• SEM-EDS JEOL JSM-IT200
• EDS Bruker XFlash 6|60
• EDS Oxford Scientific X-Max
• FlatQUAD Bruker XFlash 5060
• EBSD Bruker eFlash EBSD

Surface Chemistry and Molecular Analysis

Surface chemical analysis methods are particularly suitable for studying coatings and contamination.

• TOF.SIMS 5 IONTOF
• ESCA PHI Quantum 2000
• EPMA JXA-8600 JEOL

Spectroscopy

Spectroscopic techniques provide information on the chemical structure of materials.

• Raman Renishaw inVia Qontor
• FT-IR PerkinElmer Spectrum Two
• FT-IR PerkinElmer Spotlight 200i

Sample Preparation

• BIB Gatan Model 693 Ilion
• BIB Hitachi ArBlade 5000

Surface and Optical Measurements

• CA DPI OCA 50
• Colorimeter
• Gloss meter

X-ray Analysis

X-ray fluorescence is suitable for rapid and non-destructive elemental analysis.

• XRF PANalytical Epsilon 3XL
• Micro-XRF Bruker Xtrace

List updated: 9 January 2026