Fast, non-destructive elemental analysis for solids, powders and liquids
X-ray Fluorescence (XRF) is a rapid, non-destructive analytical technique used to determine the elemental composition of materials. By exposing a sample to a primary X-ray beam, XRF excites the atoms within the material, causing them to emit characteristic secondary X-rays. These signals reveal which elements are present and, when calibrated with reference materials, their concentrations.
XRF is widely used for quality control, failure analysis, material verification, and research across industries including metals, mining, electronics, pharmaceuticals, environmental science, and manufacturing.
What can XRF analyze?
- Elemental identification from Fluorine (F) to Uranium (U)
- Qualitative elemental analysis
- Quantitative elemental analysis (with suitable reference materials)
- Chemical composition verification
- Material identification and comparison
Key benefits
- Non-destructive analysis – preserve valuable samples
- Fast turnaround with minimal sample preparation
- Suitable for solids, powders and liquids
- High accuracy and excellent reproducibility
- Wide concentration range from ppm to 100%
- Ideal for routine quality control and research applications
Typical applications
- Material verification (PMI)
- Metal and alloy analysis
- Quality control
- Coating and surface investigations
- Failure investigations
- Research and development
- Environmental and geological samples
