X-ray fluorescence (XRF)

XRF uses primary x-ray beam to excite fluorescent radiation from a sample. This radiation is the emission of characteristic secondary x-rays of the excited atoms in the sample. The information of these secondary x-rays can be used for elemental and chemical analysis of a sample.

  • Spectrum range from Fluorine (F) to Uranium (U)
  • Qualitative analysis
  • Quantitative analysis (requires reference)
  • Non-destructive
  • Fast analyzing time
  • Suitable for solids, liquid or powders
  • Accurate, highly reproducable data
  • Wide analytical concentration range (ppm to 100%)
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XRF-equipment PANanalytical Epsilon 3
  • Top Analytica Oy Ab
  • Ruukinkatu 4, 20540 Turku, Finland (Old Mill courtyard)
  • Phone: 02-2827780
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