XRF uses primary x-ray beam to excite fluorescent radiation from a sample. This radiation is the emission of characteristic secondary x-rays of the excited atoms in the sample. The information of these secondary x-rays can be used for elemental and chemical analysis of a sample.
- Spectrum range from Fluorine (F) to Uranium (U)
- Qualitative analysis
- Quantitative analysis (requires reference)
- Fast analyzing time
- Suitable for solids, liquid or powders
- Accurate, highly reproducable data
- Wide analytical concentration range (ppm to 100%)