Speakers in alphabetical order

Konstantinos Daskalakis, University of TurkuImproving light-emitting devices by exploiting light-matter interactions
Sari Granroth, University of TurkuXPS – Studying oxides and organic materials using Ar cluster sputtering
Jiang Hua, Aalto UniversityAdvanced TEM techniques and their application in Materials Science
Eija Jokitalo, University of Helsinki3D-EM with serial block face imaging
Jyrki Juhanoja – Top AnalyticaEDS – From micro to nano analysis
Sami Kinnunen, University of JyväskyläHelium Ion Microscopy and HIM-SIMS
Risto Korpinen, LukeLuke and the need for surface Chemistry – Top A customer case
Juho Lehmusto, Åbo AkademiComplementary characterization of corroded steel samples
Radoslaw Michallik, GTK    Quantified WDS maps – EPMA
Mikko Ritala, University of HelsinkiAtomic Layer Deposition and materials characterization
Ville Saarimaa – Top Analytica  Degradation phenomena of color coated steel in humidity exposure
Turkka Salminen, University of TampereImproving materials characterization through correlative microscopy
Alexander Wärnheim, KTHPractical utilization of nanoIR techniques 
Wolfgang BetzApplications of imaging TOF-SIMS with fully integrated MS/MS capabilities
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