BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//Top Analytica - ECPv6.18.4//NONSGML v1.0//EN
CALSCALE:GREGORIAN
METHOD:PUBLISH
X-ORIGINAL-URL:https://www.topanalytica.com
X-WR-CALDESC:Tapahtumat Top Analytica
REFRESH-INTERVAL;VALUE=DURATION:PT1H
X-Robots-Tag:noindex
X-PUBLISHED-TTL:PT1H
BEGIN:VTIMEZONE
TZID:Europe/Helsinki
BEGIN:DAYLIGHT
TZOFFSETFROM:+0200
TZOFFSETTO:+0300
TZNAME:EEST
DTSTART:20230326T010000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:+0300
TZOFFSETTO:+0200
TZNAME:EET
DTSTART:20231029T010000
END:STANDARD
BEGIN:DAYLIGHT
TZOFFSETFROM:+0200
TZOFFSETTO:+0300
TZNAME:EEST
DTSTART:20240331T010000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:+0300
TZOFFSETTO:+0200
TZNAME:EET
DTSTART:20241027T010000
END:STANDARD
BEGIN:DAYLIGHT
TZOFFSETFROM:+0200
TZOFFSETTO:+0300
TZNAME:EEST
DTSTART:20250330T010000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:+0300
TZOFFSETTO:+0200
TZNAME:EET
DTSTART:20251026T010000
END:STANDARD
END:VTIMEZONE
BEGIN:VEVENT
DTSTART;TZID=Europe/Helsinki:20240919T150000
DTEND;TZID=Europe/Helsinki:20240919T160000
DTSTAMP:20250117T070856Z
CREATED:20240812T054052Z
LAST-MODIFIED:20250117T070856Z
UID:2011-1726758000-1726761600@www.topanalytica.com
SUMMARY:Webinar: Quantitative EDS Analysis
DESCRIPTION:Abstract \n\n\n\nX-ray analysis with SEM/EDS is the most widely used analytical tool for microanalysis. Its strength lies in the fast identification of all elements (Z≥Be) on a micrometer scale. The measured spectra can be quantified with high accuracy\, but this requires certain actions from the user. This webinar will focus on the factors affecting the accuracy and precision of EDS analysis: \n\n\n\n\nDefinition of accuracy and precision\n\n\n\nAnalysis with or without standards\n\n\n\nMatrix corrections (ZAF vs. φ(ρz))\n\n\n\nSelecting the measurement parameters\n\n\n\nSample preparation\n\n\n\n\nInterested in this webinar? You will receive a link to a recording by subscribing. Just add your contact information to the form below. \n\n\n\n\n  \n\n\n\n First name*\n \n \n Surname*\n \n \n Organization*\n \n \n E-mail *\n \n \n Field of business*\nAcademic institutionAnalytical servicesBiotechnologyBuilding & constructionCosmeticsElectronicsFood industryGovernmental institutionMetal & steelPaints and coatingsPharmaceuticsPulp\, paper & boardRaw-material manufacturingOther \n \nAdditional comments or requests for future webinar content:\n \n \n\nWe use the information obtained through the form to provide and improve our services. For more information\, you can find Top Analytica Ltd.'s privacy policy.\n \n\n \n\n\n\n\n\n\nCheck out also our previous webinar: Webinar 2:  Introduction to Broad Ion Beam BIB: A Preparation Tool for Microanalysis
URL:https://www.topanalytica.com/event/webinar-3
LOCATION:Top Analytica Ltd.\, Ruukinkatu 4\, TURKU\, 20540\, Finland
CATEGORIES:Webinaarit
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=Europe/Helsinki:20240927T093000
DTEND;TZID=Europe/Helsinki:20240927T103000
DTSTAMP:20241107T103805Z
CREATED:20240830T121028Z
LAST-MODIFIED:20241107T103805Z
UID:2040-1727429400-1727433000@www.topanalytica.com
SUMMARY:SEMS Keskustelutuokio: Näytteenvalmistusmenetelmät
DESCRIPTION:SEMSin vuosikokouksessa suunniteltiin kuluvan toimikauden toimintaa ja ehdotettiin aiheperusteisten keskustelutapaamisten järjestämistä etäyhteyksin.  \n\n\n\nEnsimmäinen keskustelutuokio toteutuu Tampereen yliopiston asiantuntijan johtaessa keskustelua näytteenvalmistusmenetelmistä perjantaina 27.9.2024 klo 9.30—10.30.
URL:https://www.topanalytica.com/event/sems-keskustelutuokio-naytteenvalmistusmenetelmat
CATEGORIES:Suomen SEM-käyttäjien yhteisö
ORGANIZER;CN="Suomen Elektronimikroskopian Seura SEMS":MAILTO:finnishsemusers@topanalytica.com
END:VEVENT
END:VCALENDAR